Crystal Growth Behaviors of Silicon during Melt Growth Processes

المؤلف

Fujiwara, Kozo

المصدر

International Journal of Photoenergy

العدد

المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-16، 16ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2012-03-19

دولة النشر

مصر

عدد الصفحات

16

التخصصات الرئيسية

الكيمياء

الملخص EN

It is imperative to improve the crystal quality of Si multicrystal ingots grown by casting because they are widely used for solar cells in the present and will probably expand their use in the future.

Fine control of macro- and microstructures, grain size, grain orientation, grain boundaries, dislocation/subgrain boundaries, and impurities, in a Si multicrystal ingot, is therefore necessary.

Understanding crystal growth mechanisms in melt growth processes is thus crucial for developing a good technology for producing high-quality Si multicrystal ingots for solar cells.

In this review, crystal growth mechanisms involving the morphological transformation of the crystal-melt interface, grain boundary formation, parallel-twin formation, and faceted dendrite growth are discussed on the basis of the experimental results of in situ observations.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Fujiwara, Kozo. 2012. Crystal Growth Behaviors of Silicon during Melt Growth Processes. International Journal of Photoenergy،Vol. 2012, no. 2012, pp.1-16.
https://search.emarefa.net/detail/BIM-451449

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Fujiwara, Kozo. Crystal Growth Behaviors of Silicon during Melt Growth Processes. International Journal of Photoenergy No. 2012 (2012), pp.1-16.
https://search.emarefa.net/detail/BIM-451449

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Fujiwara, Kozo. Crystal Growth Behaviors of Silicon during Melt Growth Processes. International Journal of Photoenergy. 2012. Vol. 2012, no. 2012, pp.1-16.
https://search.emarefa.net/detail/BIM-451449

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-451449