Polishing Sapphire Substrates by 355 nm Ultraviolet Laser

المؤلفون المشاركون

Wei, X.
Huang, J. F.
Hu, W.
Xie, X. Z.

المصدر

International Journal of Optics

العدد

المجلد 2012، العدد 2012 (31 ديسمبر/كانون الأول 2012)، ص ص. 1-7، 7ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2012-07-10

دولة النشر

مصر

عدد الصفحات

7

التخصصات الرئيسية

الفيزياء

الملخص EN

This paper tries to investigate a novel polishing technology with high efficiency and nice surface quality for sapphire crystal that has high hardness, wear resistance, and chemical stability.

A Q-switched 355 nm ultraviolet laser with nanosecond pulses was set up and used to polish sapphire substrate in different conditions in this paper.

Surface roughness Ra of polished sapphire was measured with surface profiler, and the surface topography was observed with scanning electronic microscope.

The effects of processing parameters as laser energy, pulse repetition rate, scanning speed, incident angle, scanning patterns, and initial surface conditions on surface roughness were analyzed.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Wei, X.& Xie, X. Z.& Hu, W.& Huang, J. F.. 2012. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics،Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-456329

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Wei, X.…[et al.]. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics No. 2012 (2012), pp.1-7.
https://search.emarefa.net/detail/BIM-456329

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Wei, X.& Xie, X. Z.& Hu, W.& Huang, J. F.. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics. 2012. Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-456329

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-456329