Polishing Sapphire Substrates by 355 nm Ultraviolet Laser

Joint Authors

Wei, X.
Huang, J. F.
Hu, W.
Xie, X. Z.

Source

International Journal of Optics

Issue

Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-7, 7 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2012-07-10

Country of Publication

Egypt

No. of Pages

7

Main Subjects

Physics

Abstract EN

This paper tries to investigate a novel polishing technology with high efficiency and nice surface quality for sapphire crystal that has high hardness, wear resistance, and chemical stability.

A Q-switched 355 nm ultraviolet laser with nanosecond pulses was set up and used to polish sapphire substrate in different conditions in this paper.

Surface roughness Ra of polished sapphire was measured with surface profiler, and the surface topography was observed with scanning electronic microscope.

The effects of processing parameters as laser energy, pulse repetition rate, scanning speed, incident angle, scanning patterns, and initial surface conditions on surface roughness were analyzed.

American Psychological Association (APA)

Wei, X.& Xie, X. Z.& Hu, W.& Huang, J. F.. 2012. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics،Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-456329

Modern Language Association (MLA)

Wei, X.…[et al.]. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics No. 2012 (2012), pp.1-7.
https://search.emarefa.net/detail/BIM-456329

American Medical Association (AMA)

Wei, X.& Xie, X. Z.& Hu, W.& Huang, J. F.. Polishing Sapphire Substrates by 355 nm Ultraviolet Laser. International Journal of Optics. 2012. Vol. 2012, no. 2012, pp.1-7.
https://search.emarefa.net/detail/BIM-456329

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-456329