Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

المؤلف

Huang, Jia-Sheng

المصدر

Advances in OptoElectronics

العدد

المجلد 2013، العدد 2013 (31 ديسمبر/كانون الأول 2013)، ص ص. 1-4، 4ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2013-12-08

دولة النشر

مصر

عدد الصفحات

4

التخصصات الرئيسية

هندسة كهربائية

الملخص EN

Effective and economical burn-in screening is important for technology development and manufacture of semiconductor lasers.

We study the burn-in degradation behavior of wavelength-division multiplexing semiconductor lasers to determine the feasibility of short burn-in.

The burn-in is characterized by the sublinear model and correlated with long-term reliability.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Huang, Jia-Sheng. 2013. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics،Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-481443

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Huang, Jia-Sheng. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics No. 2013 (2013), pp.1-4.
https://search.emarefa.net/detail/BIM-481443

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Huang, Jia-Sheng. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics. 2013. Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-481443

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-481443