Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?
Author
Source
Issue
Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-4, 4 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2013-12-08
Country of Publication
Egypt
No. of Pages
4
Main Subjects
Abstract EN
Effective and economical burn-in screening is important for technology development and manufacture of semiconductor lasers.
We study the burn-in degradation behavior of wavelength-division multiplexing semiconductor lasers to determine the feasibility of short burn-in.
The burn-in is characterized by the sublinear model and correlated with long-term reliability.
American Psychological Association (APA)
Huang, Jia-Sheng. 2013. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics،Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-481443
Modern Language Association (MLA)
Huang, Jia-Sheng. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics No. 2013 (2013), pp.1-4.
https://search.emarefa.net/detail/BIM-481443
American Medical Association (AMA)
Huang, Jia-Sheng. Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers : Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?. Advances in OptoElectronics. 2013. Vol. 2013, no. 2013, pp.1-4.
https://search.emarefa.net/detail/BIM-481443
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-481443
