Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

المؤلفون المشاركون

Biasotto, G.
Riccardi, C. S.
Simões, A. Z.
Zaghete, M. A.
Varela, J. A.
Longo, E.

المصدر

Advances in Materials Science and Engineering

العدد

المجلد 2010، العدد 2010 (31 ديسمبر/كانون الأول 2010)، ص ص. 1-7، 7ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2010-06-10

دولة النشر

مصر

عدد الصفحات

7

التخصصات الرئيسية

العلوم الهندسية و تكنولوجيا المعلومات

الملخص EN

CaBi4Ti4O15 (CBTi144) thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method.

Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM).

The films present a single phase of layered-structured perovskite with polar axis orient.

The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode.

XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films.

We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Biasotto, G.& Simões, A. Z.& Riccardi, C. S.& Zaghete, M. A.& Longo, E.& Varela, J. A.. 2010. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering،Vol. 2010, no. 2010, pp.1-7.
https://search.emarefa.net/detail/BIM-492414

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Biasotto, G.…[et al.]. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering No. 2010 (2010), pp.1-7.
https://search.emarefa.net/detail/BIM-492414

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Biasotto, G.& Simões, A. Z.& Riccardi, C. S.& Zaghete, M. A.& Longo, E.& Varela, J. A.. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering. 2010. Vol. 2010, no. 2010, pp.1-7.
https://search.emarefa.net/detail/BIM-492414

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-492414