Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy
Joint Authors
Biasotto, G.
Riccardi, C. S.
Simões, A. Z.
Zaghete, M. A.
Varela, J. A.
Longo, E.
Source
Advances in Materials Science and Engineering
Issue
Vol. 2010, Issue 2010 (31 Dec. 2010), pp.1-7, 7 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2010-06-10
Country of Publication
Egypt
No. of Pages
7
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
CaBi4Ti4O15 (CBTi144) thin films were grown on Pt/Ti/SiO2/Si substrates using a soft chemical solution and spin-coating method.
Structure and morphology of the films were characterized by the X-ray Diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), Raman analysis, X-ray photoemission spectroscopy (XPS), and transmission electron microscopy (TEM).
The films present a single phase of layered-structured perovskite with polar axis orient.
The a/b-axis orientation of the ferroelectric film is considered to be associated with the preferred orientation of the Pt bottom electrode.
XPS measurements were employed to understand the nature of defects on the retention behavior of CBTi144 films.
We have observed that the main source of retention-free characteristic of the capacitors is the oxygen environment in the CBTi144 lattice.
American Psychological Association (APA)
Biasotto, G.& Simões, A. Z.& Riccardi, C. S.& Zaghete, M. A.& Longo, E.& Varela, J. A.. 2010. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering،Vol. 2010, no. 2010, pp.1-7.
https://search.emarefa.net/detail/BIM-492414
Modern Language Association (MLA)
Biasotto, G.…[et al.]. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering No. 2010 (2010), pp.1-7.
https://search.emarefa.net/detail/BIM-492414
American Medical Association (AMA)
Biasotto, G.& Simões, A. Z.& Riccardi, C. S.& Zaghete, M. A.& Longo, E.& Varela, J. A.. Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy. Advances in Materials Science and Engineering. 2010. Vol. 2010, no. 2010, pp.1-7.
https://search.emarefa.net/detail/BIM-492414
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-492414
