On MEMS Reliability and Failure Mechanisms

المؤلفون المشاركون

Sequera, Miguel
Fonseca, Daniel J.

المصدر

International Journal of Quality, Statistics, and Reliability

العدد

المجلد 2011، العدد 2011 (31 ديسمبر/كانون الأول 2011)، ص ص. 1-7، 7ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2011-11-03

دولة النشر

مصر

عدد الصفحات

7

التخصصات الرئيسية

العلوم الاقتصادية والمالية وإدارة الأعمال
الاقتصاد

الملخص EN

Microelectromechanical systems (MEMS) are a fast-growing field in microelectronics.

MEMS are commonly used as actuators and sensors with a wide variety of applications in health care, automotives, and the military.

The MEMS production cycle can be classified as three basic steps: (1) design process, (2) manufacturing process, and (3) operating cycle.

Several studies have been conducted for steps (1) and (2); however, information regarding operational failure modes in MEMS is lacking.

This paper discusses reliability in the context of MEMS functionality.

It also presents a brief review of the most relevant failure mechanisms for MEMS.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Fonseca, Daniel J.& Sequera, Miguel. 2011. On MEMS Reliability and Failure Mechanisms. International Journal of Quality, Statistics, and Reliability،Vol. 2011, no. 2011, pp.1-7.
https://search.emarefa.net/detail/BIM-500730

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Fonseca, Daniel J.& Sequera, Miguel. On MEMS Reliability and Failure Mechanisms. International Journal of Quality, Statistics, and Reliability No. 2011 (2011), pp.1-7.
https://search.emarefa.net/detail/BIM-500730

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Fonseca, Daniel J.& Sequera, Miguel. On MEMS Reliability and Failure Mechanisms. International Journal of Quality, Statistics, and Reliability. 2011. Vol. 2011, no. 2011, pp.1-7.
https://search.emarefa.net/detail/BIM-500730

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-500730