Formal Specification Based Automatic Test Generation for Embedded Network Systems

المؤلفون المشاركون

Choi, Eun Hye
Ando, Takahiro
Yoshisaka, Keiichi
Tang, Nguyen Van
Nishihara, Hideaki
Mizuno, Osamu
Aoki, Masahiro
Ohsaki, Hitoshi

المصدر

Journal of Applied Mathematics

العدد

المجلد 2014، العدد 2014 (31 ديسمبر/كانون الأول 2014)، ص ص. 1-21، 21ص.

الناشر

Hindawi Publishing Corporation

تاريخ النشر

2014-05-11

دولة النشر

مصر

عدد الصفحات

21

التخصصات الرئيسية

الرياضيات

الملخص EN

Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated network systems.

To make their design and testing more reliable and robust, this paper proposes a formal specification language called SENS and a SENS-based automatic test generation tool called TGSENS.

Our approach is summarized as follows: (1) A user describes requirements of target embedded network systems by logical property-based constraints using SENS.

(2) Given SENS specifications, test cases are automatically generated using a SAT-based solver.

Filtering mechanisms to select efficient test cases are also available in our tool.

(3) In addition, given a testing goal by the user, test sequences are automatically extracted from exhaustive test cases.

We’ve implemented our approach and conducted several experiments on practical case studies.

Through the experiments, we confirmed the efficiency of our approach in design and test generation of real embedded air-conditioning network systems.

نمط استشهاد جمعية علماء النفس الأمريكية (APA)

Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. 2014. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics،Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348

نمط استشهاد الجمعية الأمريكية للغات الحديثة (MLA)

Choi, Eun Hye…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics No. 2014 (2014), pp.1-21.
https://search.emarefa.net/detail/BIM-507348

نمط استشهاد الجمعية الطبية الأمريكية (AMA)

Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics. 2014. Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348

نوع البيانات

مقالات

لغة النص

الإنجليزية

الملاحظات

Includes bibliographical references

رقم السجل

BIM-507348