Formal Specification Based Automatic Test Generation for Embedded Network Systems
Joint Authors
Choi, Eun Hye
Ando, Takahiro
Yoshisaka, Keiichi
Tang, Nguyen Van
Nishihara, Hideaki
Mizuno, Osamu
Aoki, Masahiro
Ohsaki, Hitoshi
Source
Journal of Applied Mathematics
Issue
Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-21, 21 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2014-05-11
Country of Publication
Egypt
No. of Pages
21
Main Subjects
Abstract EN
Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated network systems.
To make their design and testing more reliable and robust, this paper proposes a formal specification language called SENS and a SENS-based automatic test generation tool called TGSENS.
Our approach is summarized as follows: (1) A user describes requirements of target embedded network systems by logical property-based constraints using SENS.
(2) Given SENS specifications, test cases are automatically generated using a SAT-based solver.
Filtering mechanisms to select efficient test cases are also available in our tool.
(3) In addition, given a testing goal by the user, test sequences are automatically extracted from exhaustive test cases.
We’ve implemented our approach and conducted several experiments on practical case studies.
Through the experiments, we confirmed the efficiency of our approach in design and test generation of real embedded air-conditioning network systems.
American Psychological Association (APA)
Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. 2014. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics،Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348
Modern Language Association (MLA)
Choi, Eun Hye…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics No. 2014 (2014), pp.1-21.
https://search.emarefa.net/detail/BIM-507348
American Medical Association (AMA)
Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics. 2014. Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-507348