Formal Specification Based Automatic Test Generation for Embedded Network Systems

Joint Authors

Choi, Eun Hye
Ando, Takahiro
Yoshisaka, Keiichi
Tang, Nguyen Van
Nishihara, Hideaki
Mizuno, Osamu
Aoki, Masahiro
Ohsaki, Hitoshi

Source

Journal of Applied Mathematics

Issue

Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-21, 21 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2014-05-11

Country of Publication

Egypt

No. of Pages

21

Main Subjects

Mathematics

Abstract EN

Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated network systems.

To make their design and testing more reliable and robust, this paper proposes a formal specification language called SENS and a SENS-based automatic test generation tool called TGSENS.

Our approach is summarized as follows: (1) A user describes requirements of target embedded network systems by logical property-based constraints using SENS.

(2) Given SENS specifications, test cases are automatically generated using a SAT-based solver.

Filtering mechanisms to select efficient test cases are also available in our tool.

(3) In addition, given a testing goal by the user, test sequences are automatically extracted from exhaustive test cases.

We’ve implemented our approach and conducted several experiments on practical case studies.

Through the experiments, we confirmed the efficiency of our approach in design and test generation of real embedded air-conditioning network systems.

American Psychological Association (APA)

Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. 2014. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics،Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348

Modern Language Association (MLA)

Choi, Eun Hye…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics No. 2014 (2014), pp.1-21.
https://search.emarefa.net/detail/BIM-507348

American Medical Association (AMA)

Choi, Eun Hye& Nishihara, Hideaki& Ando, Takahiro& Tang, Nguyen Van& Aoki, Masahiro& Yoshisaka, Keiichi…[et al.]. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Journal of Applied Mathematics. 2014. Vol. 2014, no. 2014, pp.1-21.
https://search.emarefa.net/detail/BIM-507348

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-507348