Simple Method for Surface Selective Adsorption of Semiconductor Nanocrystals with Nanometric Resolution

Joint Authors

Paltiel, Yossi
Koslovsky, O.
Livneh, N.
Harats, M. G.
Rapaport, R.
Yochelis, Shira

Source

Journal of Nanomaterials

Issue

Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-5, 5 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2012-12-17

Country of Publication

Egypt

No. of Pages

5

Main Subjects

Chemistry
Civil Engineering

Abstract EN

Self-assembly methods play a major role in many modern fabrication techniques for various nanotechnology applications.

In this paper we demonstrate two alternatives for self-assembled patterning within the nanoscale resolution of optically active semiconductor nanocrystals.

The first is substrate selective and uses any high resolution surface patterning to achieve localized self-assembly.

The second method uses a surface with poly(methyl methacrylate) (PMMA) resist patterning adsorption of the nanocrystal with covalent bonds and liftoff.

American Psychological Association (APA)

Koslovsky, O.& Yochelis, Shira& Livneh, N.& Harats, M. G.& Rapaport, R.& Paltiel, Yossi. 2012. Simple Method for Surface Selective Adsorption of Semiconductor Nanocrystals with Nanometric Resolution. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-1029323

Modern Language Association (MLA)

Koslovsky, O.…[et al.]. Simple Method for Surface Selective Adsorption of Semiconductor Nanocrystals with Nanometric Resolution. Journal of Nanomaterials No. 2012 (2012), pp.1-5.
https://search.emarefa.net/detail/BIM-1029323

American Medical Association (AMA)

Koslovsky, O.& Yochelis, Shira& Livneh, N.& Harats, M. G.& Rapaport, R.& Paltiel, Yossi. Simple Method for Surface Selective Adsorption of Semiconductor Nanocrystals with Nanometric Resolution. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-1029323

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-1029323