Emission Mechanisms of Si Nanocrystals and Defects in SiO2 Materials
Joint Authors
Aceves-Mijares, M.
Morales, A.
Rodríguez, José Antonio
Vásquez-Agustín, Marco Antonio
Source
Issue
Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-17, 17 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2014-08-26
Country of Publication
Egypt
No. of Pages
17
Main Subjects
Abstract EN
Motivated by the necessity to have all silicon optoelectronic circuits, researchers around the world are working with light emitting silicon materials.
Such materials are silicon dielectric compounds with silicon content altered, such as silicon oxide or nitride, enriched in different ways with Silicon.
Silicon Rich Oxide or silicon dioxide enriched with silicon, and silicon rich nitride are without a doubt the most promising materials to reach this goal.
Even though they are subjected to countless studies, the light emission phenomenon has not been completely clarified.
So, a review of different proposals presented to understand the light emission phenomenon including emissions related to nanocrystals and to point defects in SiO2 is presented.
American Psychological Association (APA)
Rodríguez, José Antonio& Vásquez-Agustín, Marco Antonio& Morales, A.& Aceves-Mijares, M.. 2014. Emission Mechanisms of Si Nanocrystals and Defects in SiO2 Materials. Journal of Nanomaterials،Vol. 2014, no. 2014, pp.1-17.
https://search.emarefa.net/detail/BIM-1041513
Modern Language Association (MLA)
Rodríguez, José Antonio…[et al.]. Emission Mechanisms of Si Nanocrystals and Defects in SiO2 Materials. Journal of Nanomaterials No. 2014 (2014), pp.1-17.
https://search.emarefa.net/detail/BIM-1041513
American Medical Association (AMA)
Rodríguez, José Antonio& Vásquez-Agustín, Marco Antonio& Morales, A.& Aceves-Mijares, M.. Emission Mechanisms of Si Nanocrystals and Defects in SiO2 Materials. Journal of Nanomaterials. 2014. Vol. 2014, no. 2014, pp.1-17.
https://search.emarefa.net/detail/BIM-1041513
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1041513