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Determination of Temperature-Dependent Stress State in Thin AlGaN Layer of AlGaNGaN HEMT Heterostructures by Near-Resonant Raman Scattering
Joint Authors
Yang, Xifeng
Liu, Yanli
Chen, Dunjun
Lu, Hai
Zhang, Rong
Zheng, Youdou
Source
Advances in Condensed Matter Physics
Issue
Vol. 2015, Issue 2015 (31 Dec. 2015), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2015-03-22
Country of Publication
Egypt
No. of Pages
6
Main Subjects
Abstract EN
The temperature-dependent stress state in the AlGaN barrier layer of AlGaN/GaN heterostructure grown on sapphire substrate was investigated by ultraviolet (UV) near-resonant Raman scattering.
Strong scattering peak resulting from the A1(LO) phonon mode of AlGaN is observed under near-resonance condition, which allows for the accurate measurement of Raman shifts with temperature.
The temperature-dependent stress in the AlGaN layer determined by the resonance Raman spectra is consistent with the theoretical calculation result, taking lattice mismatch and thermal mismatch into account together.
This good agreement indicates that the UV near-resonant Raman scattering can be a direct and effective method to characterize the stress state in thin AlGaN barrier layer of AlGaN/GaN HEMT heterostructures.
American Psychological Association (APA)
Liu, Yanli& Yang, Xifeng& Chen, Dunjun& Lu, Hai& Zhang, Rong& Zheng, Youdou. 2015. Determination of Temperature-Dependent Stress State in Thin AlGaN Layer of AlGaNGaN HEMT Heterostructures by Near-Resonant Raman Scattering. Advances in Condensed Matter Physics،Vol. 2015, no. 2015, pp.1-6.
https://search.emarefa.net/detail/BIM-1052330
Modern Language Association (MLA)
Liu, Yanli…[et al.]. Determination of Temperature-Dependent Stress State in Thin AlGaN Layer of AlGaNGaN HEMT Heterostructures by Near-Resonant Raman Scattering. Advances in Condensed Matter Physics No. 2015 (2015), pp.1-6.
https://search.emarefa.net/detail/BIM-1052330
American Medical Association (AMA)
Liu, Yanli& Yang, Xifeng& Chen, Dunjun& Lu, Hai& Zhang, Rong& Zheng, Youdou. Determination of Temperature-Dependent Stress State in Thin AlGaN Layer of AlGaNGaN HEMT Heterostructures by Near-Resonant Raman Scattering. Advances in Condensed Matter Physics. 2015. Vol. 2015, no. 2015, pp.1-6.
https://search.emarefa.net/detail/BIM-1052330
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1052330