Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods
Joint Authors
Nah, Wansoo
Huynh, Hai Au
Lee, Hak-Tae
Kim, SoYoung
Source
International Journal of Antennas and Propagation
Issue
Vol. 2015, Issue 2015 (31 Dec. 2015), pp.1-11, 11 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2015-05-10
Country of Publication
Egypt
No. of Pages
11
Main Subjects
Abstract EN
Direct power injection (DPI) and bulk current injection (BCI) methods are defined in IEC 62132-3 and IEC 62132-4 as the electromagnetic immunity test method of integrated circuits (IC).
The forward power measured at the RF noise generator when the IC malfunctions is used as the measure of immunity level of the IC.
However, the actual power that causes failure in ICs is different from forward power measured at the noise source.
Power transfer efficiency is used as a measure of power loss of the noise injection path.
In this paper, the power transfer efficiencies of DPI and BCI methods are derived and validated experimentally with immunity test setup of a clock divider IC.
Power transfer efficiency varies significantly over the frequency range as a function of the test method used and the IC input impedance.
For the frequency range of 15 kHz to 1 GHz, power transfer efficiency of the BCI test was constantly higher than that of the DPI test.
In the DPI test, power transfer efficiency is particularly low in the lower test frequency range up to 10 MHz.
When performing the IC immunity tests following the standards, these characteristics of the test methods need to be considered.
American Psychological Association (APA)
Huynh, Hai Au& Lee, Hak-Tae& Nah, Wansoo& Kim, SoYoung. 2015. Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods. International Journal of Antennas and Propagation،Vol. 2015, no. 2015, pp.1-11.
https://search.emarefa.net/detail/BIM-1065098
Modern Language Association (MLA)
Huynh, Hai Au…[et al.]. Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods. International Journal of Antennas and Propagation No. 2015 (2015), pp.1-11.
https://search.emarefa.net/detail/BIM-1065098
American Medical Association (AMA)
Huynh, Hai Au& Lee, Hak-Tae& Nah, Wansoo& Kim, SoYoung. Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods. International Journal of Antennas and Propagation. 2015. Vol. 2015, no. 2015, pp.1-11.
https://search.emarefa.net/detail/BIM-1065098
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1065098