Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage
Joint Authors
Hu, Hongzhi
Guo, Qing
Tian, Shulin
Source
Journal of Applied Mathematics
Issue
Vol. 2015, Issue 2015 (31 Dec. 2015), pp.1-9, 9 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2015-03-09
Country of Publication
Egypt
No. of Pages
9
Main Subjects
Abstract EN
This paper deals with the modeling of fault for analog circuits.
A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage.
This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits.
Furthermore, in order to reduce the difficulty of fault location, an improved fault model in three-dimensional (3D) complex space is proposed, which achieves a far better fault detection ratio (FDR) against measurement error and parametric tolerance.
To address the problem of fault masking in both 2D and 3D fault models, this paper proposes an effective design for testability (DFT) method.
By adding redundant bypassing-components in the circuit under test (CUT), this method achieves excellent fault isolation ratio (FIR) in ambiguity group isolation.
The efficacy of the proposed model and testing method is validated through experimental results provided in this paper.
American Psychological Association (APA)
Hu, Hongzhi& Tian, Shulin& Guo, Qing. 2015. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Journal of Applied Mathematics،Vol. 2015, no. 2015, pp.1-9.
https://search.emarefa.net/detail/BIM-1067144
Modern Language Association (MLA)
Hu, Hongzhi…[et al.]. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Journal of Applied Mathematics No. 2015 (2015), pp.1-9.
https://search.emarefa.net/detail/BIM-1067144
American Medical Association (AMA)
Hu, Hongzhi& Tian, Shulin& Guo, Qing. Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage. Journal of Applied Mathematics. 2015. Vol. 2015, no. 2015, pp.1-9.
https://search.emarefa.net/detail/BIM-1067144
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1067144