The Reliability Improvement of Cu Interconnection by the Control of Crystallized α - TaTaN x Diffusion Barrier

Abstract EN

Ta/TaN bilayers have been deposited by a commercial self-ionized plasma (SIP) system.

The microstructures of Ta/TaN bilayers have been systematically characterized by X-ray diffraction patterns and cross-sectional transmission electron microscopy.

TaN films deposited by SIP system are amorphous.

The crystalline behavior of Ta film can be controlled by the N concentration of underlying TaN film.

On amorphous TaN film with low N concentration, overdeposited Ta film is the mixture of α- and β-phases with amorphous-like structure.

Increasing the N concentration of amorphous TaN underlayer successfully leads upper Ta film to form pure α-phase.

For the practical application, the electrical property and reliability of Cu interconnection structure have been investigated by utilizing various types of Ta/TaN diffusion barrier.

The diffusion barrier fabricated by the combination of crystallized α-Ta and TaN with high N concentration efficiently reduces the KRc and improves the EM resistance of Cu interconnection structure.