XPS Studies of LSCF Interfaces after Cell Testing
Joint Authors
DiGiuseppe, Gianfranco
Boddapati, Venkatesh
Mothikhana, Hiten
Source
Advances in Materials Science and Engineering
Issue
Vol. 2018, Issue 2018 (31 Dec. 2018), pp.1-6, 6 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2018-02-11
Country of Publication
Egypt
No. of Pages
6
Abstract EN
The motivation of this investigation is to explore the possibility of using the depth profile capability of XPS to study interfaces after SOFC button cell testing.
The literature uses XPS to study various cathode materials but has devoted little to the understanding of various cathode interfaces especially after testing.
In this work, an SOFC button cell is first tested, and then, the LSCF cathode, barrier layer, and electrolyte are sputtered away to study the behavior of different interfaces.
This work has shown that some elements have moved into other layers of the SOFC cell.
It is argued that the migration of the elements is partly due to a redeposition mechanism after atoms are sputtered away, while the rest is due to interdiffusion between the SDC and YSZ layers.
However, additional work is needed to better understand the mechanism by which atoms move around at different interfaces.
The cell electrochemical performance is also discussed in some details but is not the focus.
American Psychological Association (APA)
DiGiuseppe, Gianfranco& Boddapati, Venkatesh& Mothikhana, Hiten. 2018. XPS Studies of LSCF Interfaces after Cell Testing. Advances in Materials Science and Engineering،Vol. 2018, no. 2018, pp.1-6.
https://search.emarefa.net/detail/BIM-1121693
Modern Language Association (MLA)
DiGiuseppe, Gianfranco…[et al.]. XPS Studies of LSCF Interfaces after Cell Testing. Advances in Materials Science and Engineering No. 2018 (2018), pp.1-6.
https://search.emarefa.net/detail/BIM-1121693
American Medical Association (AMA)
DiGiuseppe, Gianfranco& Boddapati, Venkatesh& Mothikhana, Hiten. XPS Studies of LSCF Interfaces after Cell Testing. Advances in Materials Science and Engineering. 2018. Vol. 2018, no. 2018, pp.1-6.
https://search.emarefa.net/detail/BIM-1121693
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1121693