An Improved Test Selection Optimization Model Based on Fault Ambiguity Group Isolation and Chaotic Discrete PSO

Abstract EN

Sensor data-based test selection optimization is the basis for designing a test work, which ensures that the system is tested under the constraint of the conventional indexes such as fault detection rate (FDR) and fault isolation rate (FIR).

From the perspective of equipment maintenance support, the ambiguity isolation has a significant effect on the result of test selection.

In this paper, an improved test selection optimization model is proposed by considering the ambiguity degree of fault isolation.

In the new model, the fault test dependency matrix is adopted to model the correlation between the system fault and the test group.

The objective function of the proposed model is minimizing the test cost with the constraint of FDR and FIR.

The improved chaotic discrete particle swarm optimization (PSO) algorithm is adopted to solve the improved test selection optimization model.

The new test selection optimization model is more consistent with real complicated engineering systems.

The experimental result verifies the effectiveness of the proposed method.