Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials
Joint Authors
Jiang, Chenchen
Lu, Haojian
Zhang, Hongti
Lu, Yang
Shen, Yajing
Source
Issue
Vol. 2017, Issue 2017 (31 Dec. 2017), pp.1-11, 11 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2017-10-25
Country of Publication
Egypt
No. of Pages
11
Main Subjects
Information Technology and Computer Science
Abstract EN
In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the fundamental deformation and failure mechanisms for their device applications.
In this overview, we summarized recent developments on in situ SEM-based mechanical and electrical characterization techniques including tensile, compression, bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis.
In addition, the advantages and disadvantages of in situ SEM tests were also discussed with some possible solutions to address the challenges.
Furthermore, critical challenges were also discussed for the development and design of robust in situ SEM characterization platform with higher resolution and wider range of samples.
These experimental efforts have offered in-depth understanding on the mechanical and electrical properties of low-dimensional nanomaterial components and given guidelines for their further structural and functional applications.
American Psychological Association (APA)
Jiang, Chenchen& Lu, Haojian& Zhang, Hongti& Shen, Yajing& Lu, Yang. 2017. Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials. Scanning،Vol. 2017, no. 2017, pp.1-11.
https://search.emarefa.net/detail/BIM-1197834
Modern Language Association (MLA)
Jiang, Chenchen…[et al.]. Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials. Scanning No. 2017 (2017), pp.1-11.
https://search.emarefa.net/detail/BIM-1197834
American Medical Association (AMA)
Jiang, Chenchen& Lu, Haojian& Zhang, Hongti& Shen, Yajing& Lu, Yang. Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials. Scanning. 2017. Vol. 2017, no. 2017, pp.1-11.
https://search.emarefa.net/detail/BIM-1197834
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-1197834