Extraction of important parameters of a silicon diode used as particles detector
Joint Authors
Sadun, A.
Dehimi, L.
Sengouga, N.
Terghini, W.
Maghribi, M. L.
Source
Journal of New Technology and Materials
Issue
Vol. 2, Issue 2 (31 Dec. 2012), pp.29-33, 5 p.
Publisher
Larbi Ben M'hidi Oum el-Bouaghi University
Publication Date
2012-12-31
Country of Publication
Algeria
No. of Pages
5
Main Subjects
Topics
Abstract EN
The Capacitance-Voltage characteristics (C-V) and the resistivity (ρ) of a p+nn+ silicon diode used as a particle detector is numerically simulated using the finite difference method.
These characteristics permit to extract the important and useful parameters for the design of a detector diode used in a harsh environment and subjected to strong fluencies, such as the depletion voltage (Vdep), the effective concentration and the maximum resistivity, the reduction rate of the donors (c) and the introduction rate of defects (g).
When this junction is subjected to strong radiations, physical defects which are created in the semiconductor lattice have undesirable effects and can degrade the performance of the detectors.
These defects behave like deep levels and/or generation recombination (g-r) centres.
The depletion voltage and the effective concentration were calculated by using C-V characteristic.
The evolution of the effective density in function with the density of traps acceptor led as to find the redaction rate of the donors (c) and the introduction rate ( β).
American Psychological Association (APA)
Sadun, A.& Dehimi, L.& Sengouga, N.& Terghini, W.& Maghribi, M. L.. 2012. Extraction of important parameters of a silicon diode used as particles detector. Journal of New Technology and Materials،Vol. 2, no. 2, pp.29-33.
https://search.emarefa.net/detail/BIM-367574
Modern Language Association (MLA)
Sadun, A.…[et al.]. Extraction of important parameters of a silicon diode used as particles detector. Journal of New Technology and Materials Vol. 2, no. 2 (Dec. 2012), pp.29-33.
https://search.emarefa.net/detail/BIM-367574
American Medical Association (AMA)
Sadun, A.& Dehimi, L.& Sengouga, N.& Terghini, W.& Maghribi, M. L.. Extraction of important parameters of a silicon diode used as particles detector. Journal of New Technology and Materials. 2012. Vol. 2, no. 2, pp.29-33.
https://search.emarefa.net/detail/BIM-367574
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 32-33
Record ID
BIM-367574