An accurate microcontroller-based system for capacitance measurement

Author

Bani Amir, Mashhur

Source

Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series

Issue

Vol. 15, Issue 4 (31 Dec. 2000), pp.105-123, 19 p.

Publisher

Mutah University Deanship of Academic Research

Publication Date

2000-12-31

Country of Publication

Jordan

No. of Pages

19

Main Subjects

Mechanical Engineering

Abstract EN

A new accurate capacitance-measurement system comprising of a discrete capacitance-dependent oscillator and a microcontroller has been designed.

The design eliminates the parasitic capacitances and measurable humidity effects.

Moreover, it reduces the op-amp nonidealities and temperature effects to below 10 ppm/°C over the temperature range of 10 °C to 70 "C.

It can measure the capacitance up to 100 pF with resolution 40 aF and accuracy less than 80 ppm with respect to a reference capacitor.

American Psychological Association (APA)

Bani Amir, Mashhur. 2000. An accurate microcontroller-based system for capacitance measurement. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series،Vol. 15, no. 4, pp.105-123.
https://search.emarefa.net/detail/BIM-377565

Modern Language Association (MLA)

Bani Amir, Mashhur. An accurate microcontroller-based system for capacitance measurement. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series Vol. 15, no. 4 (2000), pp.105-123.
https://search.emarefa.net/detail/BIM-377565

American Medical Association (AMA)

Bani Amir, Mashhur. An accurate microcontroller-based system for capacitance measurement. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series. 2000. Vol. 15, no. 4, pp.105-123.
https://search.emarefa.net/detail/BIM-377565

Data Type

Journal Articles

Language

English

Notes

Includes appendix : p. 123

Record ID

BIM-377565