Simulation of the ebic current by the Monte-Carlo method

Joint Authors

Derras, M.
Beghdad, M.
Bu Aydah, A.
Kadoun, A.
Bouiadjra, N. Bachlr

Source

Synthèse

Issue

Vol. 2001, Issue 10 (30 Jun. 2001), pp.198-205, 8 p.

Publisher

Annaba Badji Mokhtar University

Publication Date

2001-06-30

Country of Publication

Algeria

No. of Pages

8

Main Subjects

Electronic engineering

Topics

Abstract EN

-Our work has for objective to simulate the EBIC current (Electron Beam Induced Current) by using the Monte-Carlo method that allows simulating paths of an incident beam electron in semiconductors.

By the EBIC technique, we calculate lengths of porter distribution minority created in the semiconductor volume during of collisions between incidents electrons and atoms of the target and as a result the determination of variations of the collection efficiency in function of parameters characterising the target and the incident beam.

To validate our calculation model will concentrate it on a solar cell (CdS(n +)/ZnSiAs2(p)) and to see how varies the output in this type of junction.

Keys words : EBIC, Monte-Carlo, Structures

American Psychological Association (APA)

Derras, M.& Beghdad, M.& Bu Aydah, A.& Kadoun, A.& Bouiadjra, N. Bachlr. 2001. Simulation of the ebic current by the Monte-Carlo method. Synthèse،Vol. 2001, no. 10, pp.198-205.
https://search.emarefa.net/detail/BIM-390177

Modern Language Association (MLA)

Derras, M.…[et al.]. Simulation of the ebic current by the Monte-Carlo method. Synthèse No. 10 (Jun. 2001), pp.198-205.
https://search.emarefa.net/detail/BIM-390177

American Medical Association (AMA)

Derras, M.& Beghdad, M.& Bu Aydah, A.& Kadoun, A.& Bouiadjra, N. Bachlr. Simulation of the ebic current by the Monte-Carlo method. Synthèse. 2001. Vol. 2001, no. 10, pp.198-205.
https://search.emarefa.net/detail/BIM-390177

Data Type

Journal Articles

Language

English

Notes

Includes appendix : p. 205

Record ID

BIM-390177