On the reliability of complex electronic systems
Author
Source
Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series
Issue
Vol. 6, Issue 2 (31 Dec. 1991), pp.141-154, 14 p.
Publisher
Mutah University Deanship of Academic Research
Publication Date
1991-12-31
Country of Publication
Jordan
No. of Pages
14
Main Subjects
Abstract EN
The paper presents a genera! mathematical apparatus for determining the steady stale reliability piiiameterN of complex electronic systems.
This semi-Markov approach allows the different activities jn the system to have probability distribution of general type.
Closed form expressions are derived which are the generalisation of those known in the literature for the Markov case.
American Psychological Association (APA)
Begain, Khalid. 1991. On the reliability of complex electronic systems. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series،Vol. 6, no. 2, pp.141-154.
https://search.emarefa.net/detail/BIM-400154
Modern Language Association (MLA)
Begain, Khalid. On the reliability of complex electronic systems. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series Vol. 6, no. 2 (Dec. 1991), pp.141-154.
https://search.emarefa.net/detail/BIM-400154
American Medical Association (AMA)
Begain, Khalid. On the reliability of complex electronic systems. Mu'tah Journal for Research and Studies : Natural and Applied Sciences Series. 1991. Vol. 6, no. 2, pp.141-154.
https://search.emarefa.net/detail/BIM-400154
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 154
Record ID
BIM-400154
