Antirandom Testing : A Distance-Based Approach
Joint Authors
Wu, Shen Hui
Jandhyala, Sridhar
Malaiya, Yashwant K.
Jayasumana, Anura P.
Source
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-9, 9 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2008-03-17
Country of Publication
Egypt
No. of Pages
9
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
Random testing requires each test to be selected randomly regardless of the tests previously applied.
This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum.
This spans the test vector space to the maximum extent possible for a given number of vectors.
An algorithm for generating antirandom tests is presented.
Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high-fault coverage needs to be achieved with a limited number of test vectors.
The superiority of the new approach is even more significant for testing bridging faults.
American Psychological Association (APA)
Wu, Shen Hui& Jandhyala, Sridhar& Malaiya, Yashwant K.& Jayasumana, Anura P.. 2008. Antirandom Testing : A Distance-Based Approach. VLSI Design،Vol. 2008, no. 2008, pp.1-9.
https://search.emarefa.net/detail/BIM-451136
Modern Language Association (MLA)
Wu, Shen Hui…[et al.]. Antirandom Testing : A Distance-Based Approach. VLSI Design No. 2008 (2008), pp.1-9.
https://search.emarefa.net/detail/BIM-451136
American Medical Association (AMA)
Wu, Shen Hui& Jandhyala, Sridhar& Malaiya, Yashwant K.& Jayasumana, Anura P.. Antirandom Testing : A Distance-Based Approach. VLSI Design. 2008. Vol. 2008, no. 2008, pp.1-9.
https://search.emarefa.net/detail/BIM-451136
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-451136