Antirandom Testing : A Distance-Based Approach

Joint Authors

Wu, Shen Hui
Jandhyala, Sridhar
Malaiya, Yashwant K.
Jayasumana, Anura P.

Source

VLSI Design

Issue

Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-9, 9 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2008-03-17

Country of Publication

Egypt

No. of Pages

9

Main Subjects

Engineering Sciences and Information Technology

Abstract EN

Random testing requires each test to be selected randomly regardless of the tests previously applied.

This paper introduces the concept of antirandom testing where each test applied is chosen such that its total distance from all previous tests is maximum.

This spans the test vector space to the maximum extent possible for a given number of vectors.

An algorithm for generating antirandom tests is presented.

Compared with traditional pseudorandom testing, antirandom testing is found to be very effective when a high-fault coverage needs to be achieved with a limited number of test vectors.

The superiority of the new approach is even more significant for testing bridging faults.

American Psychological Association (APA)

Wu, Shen Hui& Jandhyala, Sridhar& Malaiya, Yashwant K.& Jayasumana, Anura P.. 2008. Antirandom Testing : A Distance-Based Approach. VLSI Design،Vol. 2008, no. 2008, pp.1-9.
https://search.emarefa.net/detail/BIM-451136

Modern Language Association (MLA)

Wu, Shen Hui…[et al.]. Antirandom Testing : A Distance-Based Approach. VLSI Design No. 2008 (2008), pp.1-9.
https://search.emarefa.net/detail/BIM-451136

American Medical Association (AMA)

Wu, Shen Hui& Jandhyala, Sridhar& Malaiya, Yashwant K.& Jayasumana, Anura P.. Antirandom Testing : A Distance-Based Approach. VLSI Design. 2008. Vol. 2008, no. 2008, pp.1-9.
https://search.emarefa.net/detail/BIM-451136

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-451136