Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities

Joint Authors

Alves, Andrew D.
Thompson, Samuel C.
van Donkelaar, Jessica A.
McCallum, Jeffrey C.
Johnson, Brett C.
Jamieson, David N.
Yang, Changyi
Hopf, Toby

Source

Advances in Materials Science and Engineering

Issue

Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-10, 10 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2011-11-28

Country of Publication

Egypt

No. of Pages

10

Main Subjects

Engineering Sciences and Information Technology

Abstract EN

Interest in single-ion implantation is driven in part by research into development of solid-state devices that exhibit quantum behaviour in their electronic or optical characteristics.

Here, we provide an overview of international research work on single ion implantation and single ion detection for development of electronic devices for quantum computing.

The scope of international research into single ion implantation is presented in the context of our own research in the Centre for Quantum Computation and Communication Technology in Australia.

Various single ion detection schemes are presented, and limitations on dopant placement accuracy due to ion straggling are discussed together with pathways for scale-up to multiple quantum devices on the one chip.

Possible future directions for ion implantation in quantum computing and communications are also discussed.

American Psychological Association (APA)

McCallum, Jeffrey C.& Jamieson, David N.& Yang, Changyi& Alves, Andrew D.& Johnson, Brett C.& Hopf, Toby…[et al.]. 2011. Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities. Advances in Materials Science and Engineering،Vol. 2012, no. 2012, pp.1-10.
https://search.emarefa.net/detail/BIM-459302

Modern Language Association (MLA)

McCallum, Jeffrey C.…[et al.]. Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities. Advances in Materials Science and Engineering No. 2012 (2012), pp.1-10.
https://search.emarefa.net/detail/BIM-459302

American Medical Association (AMA)

McCallum, Jeffrey C.& Jamieson, David N.& Yang, Changyi& Alves, Andrew D.& Johnson, Brett C.& Hopf, Toby…[et al.]. Single-Ion Implantation for the Development of Si-Based MOSFET Devices with Quantum Functionalities. Advances in Materials Science and Engineering. 2011. Vol. 2012, no. 2012, pp.1-10.
https://search.emarefa.net/detail/BIM-459302

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-459302