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Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film
Joint Authors
Andrulevičius, Mindaugas
Krylova, Valentina
Source
International Journal of Photoenergy
Issue
Vol. 2009, Issue 2009 (31 Dec. 2009), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2009-11-22
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Abstract EN
Copper sulfide layers were formed on polyamide PA 6 surface using the sorption-diffusion method.
Polymer samples were immersed for 4 and 5 h in 0.15 mol⋅dm−3 K2S5O6 solutions and acidified with HCl (0.1 mol⋅dm−3) at 20∘C.
After washing and drying, the samples were treated with Cu(I) salt solution.
The samples were studied by UV/VIS, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) methods.
All methods confirmed that on the surface of the polyamide film a layer of copper sulfide was formed.
The copper sulfide layers are indirect band-gap semiconductors.
The values of Ebg are 1.25 and 1.3 eV for 4 h and 5 h sulfured PA 6 respectively.
Copper XPS spectra analyses showed Cu(I) bonds only in deeper layers of the formed film, while in sulfur XPS S 2p spectra dominating sulfide bonds were found after cleaning the surface with Ar+ ions.
It has been established by the XRD method that, beside Cu2S, the layer contains Cu1.9375S as well.
For PA 6 initially sulfured 4 h, grain size for chalcocite, Cu2S, was ∼35.60 nm and for djurleite, Cu1.9375S, it was 54.17 nm.
The sheet resistance of the obtained layer varies from 6300 to 102 Ω/cm2.
American Psychological Association (APA)
Krylova, Valentina& Andrulevičius, Mindaugas. 2009. Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film. International Journal of Photoenergy،Vol. 2009, no. 2009, pp.1-8.
https://search.emarefa.net/detail/BIM-461854
Modern Language Association (MLA)
Krylova, Valentina& Andrulevičius, Mindaugas. Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film. International Journal of Photoenergy No. 2009 (2009), pp.1-8.
https://search.emarefa.net/detail/BIM-461854
American Medical Association (AMA)
Krylova, Valentina& Andrulevičius, Mindaugas. Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film. International Journal of Photoenergy. 2009. Vol. 2009, no. 2009, pp.1-8.
https://search.emarefa.net/detail/BIM-461854
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-461854