Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Abstract EN

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology.

Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique.

From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude.

It has been established that samples showing low noise feature high-conversion efficiency.

The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.