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Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems
Joint Authors
Chatterjee, Abhjit
Sen, Shreyas
Natarajan, Vishwanath
Senguttuvan, Rajarajan
Source
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-10, 10 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2008-06-23
Country of Publication
Egypt
No. of Pages
10
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
Built-In RF test is a challenging problem due to the need to measure the values of complex test specifications on-chip with the precision of external RF test equipment.
BIT techniques are necessary for guiding system adaptation during field operation.
Prior research has demonstrated that embedded RF sensors can generate significant information about RF circuit performance.
In this paper, we propose a test methodology that enables efficient BIT and BIT-enabled tuning of RF systems.
A test generation approach is developed that co-optimizes the applied test stimulus, the type of embedded sensors, and the system response capture mechanisms for maximal accuracy of the BIT procedure.
This BIT technique is also used to perform diagnostic testing of the transmitter.
The information gathered from diagnosis is used to tune the transmitter for improved performance.
Simulation results demonstrate that BIT-assisted diagnosis and tuning can be performed with good accuracy using the proposed methodology.
American Psychological Association (APA)
Natarajan, Vishwanath& Senguttuvan, Rajarajan& Sen, Shreyas& Chatterjee, Abhjit. 2008. Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design،Vol. 2008, no. 2008, pp.1-10.
https://search.emarefa.net/detail/BIM-470619
Modern Language Association (MLA)
Natarajan, Vishwanath…[et al.]. Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design No. 2008 (2008), pp.1-10.
https://search.emarefa.net/detail/BIM-470619
American Medical Association (AMA)
Natarajan, Vishwanath& Senguttuvan, Rajarajan& Sen, Shreyas& Chatterjee, Abhjit. Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design. 2008. Vol. 2008, no. 2008, pp.1-10.
https://search.emarefa.net/detail/BIM-470619
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-470619