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Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD
Joint Authors
Ezzaouia, H.
Saadallah, Faycel
Ktifa, S.
Yacoubi, Noureddine
Ghrib, M.
Source
International Journal of Photoenergy
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-5, 5 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-04-12
Country of Publication
Egypt
No. of Pages
5
Main Subjects
Abstract EN
We have studied the optical properties of nanocrystalline silicon (nc-Si) film deposited by plasma enhancement chemical vapor deposition (PECVD) on porous aluminum structure using, respectively, the Photothermal Deflection Spectroscopy (PDS) and Photoluminescence (PL).
The aim of this work is to investigate the influence of anodisation current on the optical properties of the porous aluminum silicon layers (PASL).
The morphology characterization studied by atomic force microscopy (AFM) technique has shown that the grain size of (nc-Si) increases with the anodisation current.
However, a band gap shift of the energy gap was observed.
American Psychological Association (APA)
Ktifa, S.& Ghrib, M.& Saadallah, Faycel& Ezzaouia, H.& Yacoubi, Noureddine. 2012. Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD. International Journal of Photoenergy،Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-470688
Modern Language Association (MLA)
Ktifa, S.…[et al.]. Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD. International Journal of Photoenergy No. 2012 (2012), pp.1-5.
https://search.emarefa.net/detail/BIM-470688
American Medical Association (AMA)
Ktifa, S.& Ghrib, M.& Saadallah, Faycel& Ezzaouia, H.& Yacoubi, Noureddine. Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD. International Journal of Photoenergy. 2012. Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-470688
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-470688