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The Impact of Statistical Leakage Models on Design Yield Estimation
Joint Authors
Kanj, Rouwaida
Joshi, Rajiv
Nassif, Sani
Source
Issue
Vol. 2011, Issue 2011 (31 Dec. 2011), pp.1-12, 12 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2011-02-22
Country of Publication
Egypt
No. of Pages
12
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
Device mismatch and process variation models play a key role in determining the functionality and yield of sub-100 nm design.
Average characteristics are often of interest, such as the average leakage current or the average read delay.
However, detecting rare functional fails is critical for memory design and designers often seek techniques that enable accurately modeling such events.
Extremely leaky devices can inflict functionality fails.
The plurality of leaky devices on a bitline increase the dimensionality of the yield estimation problem.
Simplified models are possible by adopting approximations to the underlying sum of lognormals.
The implications of such approximations on tail probabilities may in turn bias the yield estimate.
We review different closed form approximations and compare against the CDF matching method, which is shown to be most effective method for accurate statistical leakage modeling.
American Psychological Association (APA)
Kanj, Rouwaida& Joshi, Rajiv& Nassif, Sani. 2011. The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design،Vol. 2011, no. 2011, pp.1-12.
https://search.emarefa.net/detail/BIM-474185
Modern Language Association (MLA)
Kanj, Rouwaida…[et al.]. The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design No. 2011 (2011), pp.1-12.
https://search.emarefa.net/detail/BIM-474185
American Medical Association (AMA)
Kanj, Rouwaida& Joshi, Rajiv& Nassif, Sani. The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design. 2011. Vol. 2011, no. 2011, pp.1-12.
https://search.emarefa.net/detail/BIM-474185
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-474185