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ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator
Joint Authors
Chakib, O.
Kerzérho, V.
Azaïs, F.
Comte, M.
Cauvet, P.
Bernard, S.
Renovell, M.
Source
Issue
Vol. 2008, Issue 2008 (31 Dec. 2008), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2008-04-30
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
Standard production test techniques for ADC require an ATE with an arbitrary waveform generator (AWG) with a resolution at least 2 bits higher than the ADC under test resolution.
This requirement is a real issue for the new high-performance ADCs.
This paper proposes a test solution that relaxes this constraint.
The technique allows the test of ADC harmonic distortions using only low-cost ATE.
The method involves two steps.
The first step, called the learning phase, consists in extracting the harmonic contributions from the AWG.
These characteristics are then used during the second step, called the production test, to discriminate the harmonic distortions induced by the ADC under test from the ones created by the generator.
Hardware experimentations are presented to validate the proposed approach.
American Psychological Association (APA)
Kerzérho, V.& Cauvet, P.& Bernard, S.& Azaïs, F.& Renovell, M.& Comte, M.…[et al.]. 2008. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design،Vol. 2008, no. 2008, pp.1-8.
https://search.emarefa.net/detail/BIM-475075
Modern Language Association (MLA)
Kerzérho, V.…[et al.]. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design No. 2008 (2008), pp.1-8.
https://search.emarefa.net/detail/BIM-475075
American Medical Association (AMA)
Kerzérho, V.& Cauvet, P.& Bernard, S.& Azaïs, F.& Renovell, M.& Comte, M.…[et al.]. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design. 2008. Vol. 2008, no. 2008, pp.1-8.
https://search.emarefa.net/detail/BIM-475075
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-475075