Electrical Properties of Rapidly Annealed Ir and IrAu Schottky Contacts on n-Type InGaN
Joint Authors
Prasanna Lakshmi, B.
Padma, R.
Reddy, V. Rajagopal
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-9, 9 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-02-08
Country of Publication
Egypt
No. of Pages
9
Main Subjects
Abstract EN
The effect of annealing temperature on electrical characteristics of iridium (Ir) and iridium/gold (Ir/Au) Schottky contacts to n-type InGaN have been investigated by means of current-voltage (I-V) and capacitance-voltage (C-V) techniques.
It is observed that the barrier height of Ir/n-InGaN and Au/Ir/n-InGaN Schottky diodes increases after annealing at 300∘C for 1 min in N2 ambient compared to the as-deposited.
However, the barrier heights are found to be decreased somewhat after annealing at 500∘C for the both Ir and Ir/Au Schottky contacts.
From the above observations, it is clear that the optimum annealing temperature for both Ir and Ir/Au Schottky contacts is 300∘C.
Moreover, the barrier height (ϕb), ideality factor (n) and series resistance (RS) are determined using Cheung’s and Norde methods.
Besides, the energy distribution of interface state densities are determined from the forward bias I-V characteristics by taking into account the bias dependence of the effective barrier height.
Based on the above results, it is clear that both Ir and Ir/Au Schottky contacts exhibit a kind of thermal stability during annealing.
American Psychological Association (APA)
Reddy, V. Rajagopal& Prasanna Lakshmi, B.& Padma, R.. 2012. Electrical Properties of Rapidly Annealed Ir and IrAu Schottky Contacts on n-Type InGaN. Journal of Metallurgy،Vol. 2012, no. 2012, pp.1-9.
https://search.emarefa.net/detail/BIM-479207
Modern Language Association (MLA)
Reddy, V. Rajagopal…[et al.]. Electrical Properties of Rapidly Annealed Ir and IrAu Schottky Contacts on n-Type InGaN. Journal of Metallurgy No. 2012 (2012), pp.1-9.
https://search.emarefa.net/detail/BIM-479207
American Medical Association (AMA)
Reddy, V. Rajagopal& Prasanna Lakshmi, B.& Padma, R.. Electrical Properties of Rapidly Annealed Ir and IrAu Schottky Contacts on n-Type InGaN. Journal of Metallurgy. 2012. Vol. 2012, no. 2012, pp.1-9.
https://search.emarefa.net/detail/BIM-479207
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-479207