Y-Function Analysis of the Low Temperature Behavior of Ultrathin Film FD SOI MOSFETs
Joint Authors
Chelly, Avraham
Karsenty, Avraham
Source
Active and Passive Electronic Components
Issue
Vol. 2014, Issue 2014 (31 Dec. 2014), pp.1-10, 10 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2014-06-11
Country of Publication
Egypt
No. of Pages
10
Main Subjects
Abstract EN
The respective transfer characteristics of the ultrathin body (UTB) and gate recessed channel (GRC) device, sharing same W/L ratio but having a channel thickness of 46 nm, and 2.2 nm respectively, were measured at 300 K and at 77 K.
By decreasing the temperature we found that the electrical behaviors of these devices were radically opposite: if for UTB device, the conductivity was increased, the opposite effect was observed for GRC.
The low field electron mobility and series resistance RSD values were extracted using a method based on Y-function for both the temperatures.
If RSD low values were found for UTB, very high values (>1 MΩ) were extracted for GRC.
Surprisingly, for the last device, the effective field mobility is found very low (<1 cm2/Vs) and is decreasing by lowering the temperature.
After having discussed the limits of this analysis.This case study illustrates the advantage of the Y-analysis in discriminating a parameter of great relevance for nanoscale devices and gives a coherent interpretation of an anomalous electrical behavior.
American Psychological Association (APA)
Karsenty, Avraham& Chelly, Avraham. 2014. Y-Function Analysis of the Low Temperature Behavior of Ultrathin Film FD SOI MOSFETs. Active and Passive Electronic Components،Vol. 2014, no. 2014, pp.1-10.
https://search.emarefa.net/detail/BIM-491438
Modern Language Association (MLA)
Karsenty, Avraham& Chelly, Avraham. Y-Function Analysis of the Low Temperature Behavior of Ultrathin Film FD SOI MOSFETs. Active and Passive Electronic Components No. 2014 (2014), pp.1-10.
https://search.emarefa.net/detail/BIM-491438
American Medical Association (AMA)
Karsenty, Avraham& Chelly, Avraham. Y-Function Analysis of the Low Temperature Behavior of Ultrathin Film FD SOI MOSFETs. Active and Passive Electronic Components. 2014. Vol. 2014, no. 2014, pp.1-10.
https://search.emarefa.net/detail/BIM-491438
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-491438