Detection and Localization of Defects in Monocrystalline Silicon Solar Cell
Joint Authors
Grmela, L.
Škarvada, P.
Tománek, P.
Macků, R.
Source
Advances in Optical Technologies
Issue
Vol. 2010, Issue 2010 (31 Dec. 2010), pp.1-5, 5 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2010-05-30
Country of Publication
Egypt
No. of Pages
5
Main Subjects
Engineering Sciences and Information Technology
Abstract EN
Near-surface defects in solar cell wafer have undesirable influence upon device properties, as its efficiency and lifetime.
When reverse-bias voltage is applied to the wafer, a magnitude of electric signals from defects can be measured electronically, but the localization of defects is difficult using classical optical far-field methods.
Therefore, the paper introduces a novel combination of electric and optical methods showing promise of being useful in detection and localization of defects with resolution of 250 nm using near-field nondestructive characterization techniques.
The results of mapped topography, local surface reflection, and local light to electric energy conversion measurement in areas with small defects strongly support the development and further evaluation of the technique.
American Psychological Association (APA)
Tománek, P.& Škarvada, P.& Macků, R.& Grmela, L.. 2010. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Advances in Optical Technologies،Vol. 2010, no. 2010, pp.1-5.
https://search.emarefa.net/detail/BIM-499462
Modern Language Association (MLA)
Tománek, P.…[et al.]. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Advances in Optical Technologies No. 2010 (2010), pp.1-5.
https://search.emarefa.net/detail/BIM-499462
American Medical Association (AMA)
Tománek, P.& Škarvada, P.& Macků, R.& Grmela, L.. Detection and Localization of Defects in Monocrystalline Silicon Solar Cell. Advances in Optical Technologies. 2010. Vol. 2010, no. 2010, pp.1-5.
https://search.emarefa.net/detail/BIM-499462
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-499462