Vapor Phase Sensing Using Metal Nanorod Thin Films Grown by Cryogenic Oblique Angle Deposition

Joint Authors

Ju, Dongquan
Sarangan, Andrew M.
Niu, Xiaoxu
Shah, Piyush

Source

Journal of Sensors

Issue

Vol. 2013, Issue 2013 (31 Dec. 2013), pp.1-6, 6 p.

Publisher

Hindawi Publishing Corporation

Publication Date

2013-12-23

Country of Publication

Egypt

No. of Pages

6

Main Subjects

Civil Engineering

Abstract EN

We demonstrate the chemical sensing capability of silver nanostructured films grown by cryogenic oblique angle deposition (OAD).

For comparison, the films are grown side by side at cryogenic (~100 K) and at room temperature (~300 K) by e-beam evaporation.

Based on the observed structural differences, it was hypothesized that the cryogenic OAD silver films should show an increased surface enhanced Raman scattering (SERS) sensitivity.

COMSOL simulation results are presented to validate this hypothesis.

Experimental SERS results of 4-aminobenzenethiol (4-ABT) Raman test probe molecules in vapor phase show good agreement with the simulation and indicate promising SERS applications for these nanostructured thin films.

American Psychological Association (APA)

Shah, Piyush& Ju, Dongquan& Niu, Xiaoxu& Sarangan, Andrew M.. 2013. Vapor Phase Sensing Using Metal Nanorod Thin Films Grown by Cryogenic Oblique Angle Deposition. Journal of Sensors،Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-500905

Modern Language Association (MLA)

Shah, Piyush…[et al.]. Vapor Phase Sensing Using Metal Nanorod Thin Films Grown by Cryogenic Oblique Angle Deposition. Journal of Sensors No. 2013 (2013), pp.1-6.
https://search.emarefa.net/detail/BIM-500905

American Medical Association (AMA)

Shah, Piyush& Ju, Dongquan& Niu, Xiaoxu& Sarangan, Andrew M.. Vapor Phase Sensing Using Metal Nanorod Thin Films Grown by Cryogenic Oblique Angle Deposition. Journal of Sensors. 2013. Vol. 2013, no. 2013, pp.1-6.
https://search.emarefa.net/detail/BIM-500905

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references

Record ID

BIM-500905