SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise
Joint Authors
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-4, 4 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-01-09
Country of Publication
Egypt
No. of Pages
4
Main Subjects
Abstract EN
The knowledge of the noise levels is important for pump laser diodes as it allows to study and to locate the noise sources and their origin.
980 nm fresh and aged pump lasers have been characterized by using electrical noise measurements.
At 10 Hz, the spectra are dominated by 1/fm (1≤m≤2) noise.
Current noise spectral density (CNSD) is dominated by IL m (1 The trapping defect density near the n+n- and p+p- interfaces is related to pinching of the space-charge-limited current (SCLC) effect. An excess electrical noise due to longitudinal mode hopping is correlated with optical power fluctuations.
American Psychological Association (APA)
Orsal, B.& Asaad, I.. 2012. SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise. ISRN Optics،Vol. 2012, no. 2012, pp.1-4.
https://search.emarefa.net/detail/BIM-502522
Modern Language Association (MLA)
Orsal, B.& Asaad, I.. SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise. ISRN Optics No. 2012 (2012), pp.1-4.
https://search.emarefa.net/detail/BIM-502522
American Medical Association (AMA)
Orsal, B.& Asaad, I.. SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise. ISRN Optics. 2012. Vol. 2012, no. 2012, pp.1-4.
https://search.emarefa.net/detail/BIM-502522
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-502522
