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Morphology and electrical properties of Cu X Zn1-XO thin films prepared by PLD technique
Other Title(s)
الخصائص التركيبية و الكهربائية للأغشية الرقيقية Cu X Zn1-XO المحضرة بتقنية (PLD)
Joint Authors
Nasir, Iman Muzhir
Ali, Asma Natiq Muhammad
Adim, Kazim Abd al-Wahid
Source
Issue
Vol. 14, Issue 29 (30 Apr. 2016), pp.8-14, 7 p.
Publisher
University of Baghdad College of Science
Publication Date
2016-04-30
Country of Publication
Iraq
No. of Pages
7
Main Subjects
Abstract EN
Cu X Zn1-XO films with different x content have been prepared by pulse laser deposition technique at room temperatures (RT) and different annealing temperatures (373 and 473) K.
The effect of x content of Cu (0, 0.2, 0.4, 0.6, 0.8) wt.% on morphology and electrical properties of CuXZn1-XO thin films have been studied.
AFM measurements showed that the average grain size values for CuXZn1-xO thin films at RT and different annealing temperatures (373, 473) K decreases, while the average Roughness values increase with increasing x content.
The D.C conductivity for all films increases as the x content increase and decreases with increasing the annealing temperatures.
Hall measurements showed that there are two types of conductance (n- type and p-type charge carriers).
Also the variation of drift velocity (vd), carrier life time (), and free mean path (l) with different x content and annealing temperatures were measured.
American Psychological Association (APA)
Nasir, Iman Muzhir& Ali, Asma Natiq Muhammad& Adim, Kazim Abd al-Wahid. 2016. Morphology and electrical properties of Cu X Zn1-XO thin films prepared by PLD technique. Iraqi Journal of Physics،Vol. 14, no. 29, pp.8-14.
https://search.emarefa.net/detail/BIM-722763
Modern Language Association (MLA)
Nasir, Iman Muzhir…[et al.]. Morphology and electrical properties of Cu X Zn1-XO thin films prepared by PLD technique. Iraqi Journal of Physics Vol. 14, no. 29 (Apr. 2016), pp.8-14.
https://search.emarefa.net/detail/BIM-722763
American Medical Association (AMA)
Nasir, Iman Muzhir& Ali, Asma Natiq Muhammad& Adim, Kazim Abd al-Wahid. Morphology and electrical properties of Cu X Zn1-XO thin films prepared by PLD technique. Iraqi Journal of Physics. 2016. Vol. 14, no. 29, pp.8-14.
https://search.emarefa.net/detail/BIM-722763
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 14
Record ID
BIM-722763