![](/images/graphics-bg.png)
Barrier height and changing insulator thickness of thin film MIS junctions
Other Title(s)
ارتفاع الحاجز و تغيير سمك العازل للأغشية الرقيقة لوصلات معدن عازل-شبه موصل
Author
Source
Journal of University of Anbar for Pure Science
Issue
Vol. 10, Issue 3 (31 Dec. 2016), pp.35-40, 6 p.
Publisher
University of Anbar College of Science
Publication Date
2016-12-31
Country of Publication
Iraq
No. of Pages
6
Main Subjects
Economics & Business Administration
Abstract EN
Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared.
By using experimental I-V and activation energy measurements, it was determined that barrier height ( ) increases as the thickness of the insulator increases.
American Psychological Association (APA)
Salih, Jasim Muhammad. 2016. Barrier height and changing insulator thickness of thin film MIS junctions. Journal of University of Anbar for Pure Science،Vol. 10, no. 3, pp.35-40.
https://search.emarefa.net/detail/BIM-816291
Modern Language Association (MLA)
Salih, Jasim Muhammad. Barrier height and changing insulator thickness of thin film MIS junctions. Journal of University of Anbar for Pure Science Vol. 10, no. 3 (2016), pp.35-40.
https://search.emarefa.net/detail/BIM-816291
American Medical Association (AMA)
Salih, Jasim Muhammad. Barrier height and changing insulator thickness of thin film MIS junctions. Journal of University of Anbar for Pure Science. 2016. Vol. 10, no. 3, pp.35-40.
https://search.emarefa.net/detail/BIM-816291
Data Type
Journal Articles
Language
English
Record ID
BIM-816291