Structural characterizations, optical and electrical properties of zinc oxide thin films grown by atomic layer deposition method
Other Title(s)
المميزات البنيوية و الخصائص الضوئية و الكهربائية لأفلام رقيقة من أكسيد الزنك منماة بطريقة الترسيب الذري الطبقي
Joint Authors
Source
Tishreen University Journal for Research and Scientific Studies : Basic Sciences Series
Issue
Vol. 35, Issue 4 (31 Dec. 2013), pp.125-133, 9 p.
Publisher
Publication Date
2013-12-31
Country of Publication
Syria
No. of Pages
9
Main Subjects
Natural & Life Sciences (Multidisciplinary)
American Psychological Association (APA)
Khallas, Talal& Sarim, Ammar. 2013. Structural characterizations, optical and electrical properties of zinc oxide thin films grown by atomic layer deposition method. Tishreen University Journal for Research and Scientific Studies : Basic Sciences Series،Vol. 35, no. 4, pp.125-133.
https://search.emarefa.net/detail/BIM-830474
Modern Language Association (MLA)
Khallas, Talal& Sarim, Ammar. Structural characterizations, optical and electrical properties of zinc oxide thin films grown by atomic layer deposition method. Tishreen University Journal for Research and Scientific Studies : Basic Sciences Series Vol. 35, no. 4 (2013), pp.125-133.
https://search.emarefa.net/detail/BIM-830474
American Medical Association (AMA)
Khallas, Talal& Sarim, Ammar. Structural characterizations, optical and electrical properties of zinc oxide thin films grown by atomic layer deposition method. Tishreen University Journal for Research and Scientific Studies : Basic Sciences Series. 2013. Vol. 35, no. 4, pp.125-133.
https://search.emarefa.net/detail/BIM-830474
Data Type
Journal Articles
Language
English
Notes
Record ID
BIM-830474
