Microstructure, creep deformation behavior and reliability of Sn-6.5wt % Zn-0.3 wt % Cu lead free solder after Bi additions

Joint Authors

Fadil, M. M.
al-Khawas, E. H.

Source

Arab Journal of Nuclear Sciences and Applications

Issue

Vol. 52, Issue 2 (30 Apr. 2019), pp.103-111, 9 p.

Publisher

The Egyptian Society of Nuclear Science and Applications

Publication Date

2019-04-30

Country of Publication

Egypt

No. of Pages

9

Main Subjects

Physics

Abstract EN

Creep characteristics of Sn-6.5 Zn-0.3 Cu plain solder was studied and compared with Sn-6.5 Zn-0.3 Cu-1 Bi and Sn-6.5 Zn-0.3 Cu-3 Bi solder alloys.

The results show that 3Bi-containing alloy solder has the higher creep resistance (~80 times) than the other two solders at the same stress level and testing temperatures.

The higher creep resistance was attributed to the solid solution and precipitations strengthening effects of Bi atoms.

The precipitation of Bi atoms or particles can significantly refine the microstructure, blocks the movement of dislocations and increases the creep resistance of Bi-containing solders.

Moreover, the creep life time of plain SZC plain solder alloy was extremely enlarged (~23.7 times) with the addition of 3 wt.

% Bi, which could result in improving the reliability of Bi-containing solders.

Additionally, the minimum creep strain rate in the steady state flow is developed during secondary creep and Garofalo model was created from the experimental data to predict the creep deformation mechanism.

Based on the obtained stress exponents and activation energies, it is proposed that the dominant deformation mechanism is dislocation climb over the whole temperature range investigated.

American Psychological Association (APA)

al-Khawas, E. H.& Fadil, M. M.. 2019. Microstructure, creep deformation behavior and reliability of Sn-6.5wt % Zn-0.3 wt % Cu lead free solder after Bi additions. Arab Journal of Nuclear Sciences and Applications،Vol. 52, no. 2, pp.103-111.
https://search.emarefa.net/detail/BIM-892208

Modern Language Association (MLA)

al-Khawas, E. H.& Fadil, M. M.. Microstructure, creep deformation behavior and reliability of Sn-6.5wt % Zn-0.3 wt % Cu lead free solder after Bi additions. Arab Journal of Nuclear Sciences and Applications Vol. 52, no. 2 (Apr. 2019), pp.103-111.
https://search.emarefa.net/detail/BIM-892208

American Medical Association (AMA)

al-Khawas, E. H.& Fadil, M. M.. Microstructure, creep deformation behavior and reliability of Sn-6.5wt % Zn-0.3 wt % Cu lead free solder after Bi additions. Arab Journal of Nuclear Sciences and Applications. 2019. Vol. 52, no. 2, pp.103-111.
https://search.emarefa.net/detail/BIM-892208

Data Type

Journal Articles

Language

English

Notes

Includes bibliographical references : p. 111

Record ID

BIM-892208