Optical characterizations of rf-magnetron sputtered nanocrystalline tio2 thin film
Author
Source
Engineering and Technology Journal
Issue
Vol. 36, Issue 2B (28 Feb. 2018), pp.156-159, 4 p.
Publisher
Publication Date
2018-02-28
Country of Publication
Iraq
No. of Pages
4
Main Subjects
Information Technology and Computer Science
Abstract EN
TiO2 nanocrystalline thin films are widely used as antireflection coating in solar cell, in this paper, RF magnetron sputtering technique is used to prepare TiO2 thin film on glass substrates, TiO2 thin films deposited under different powers (75,100,125 and 150) Watt for (1.5) hour resulted in different layer thickness (62.5,88,118 and 132.6) nm respectively.
The optical properties examined by UV-VIS spectroscopy.
TiO2 thin films exhibit a high transparency in the region from about 3 50 nm above, we suggest that these results indicate the most suitable growing conditions for obtaining high quality sputtered TiO2 thin films with higher transparence performance for solar cell application.
the optical absorbance coefficient for all films were genuinely high esteems coming to above 104 cm-1, which implies that there is allowed direct transitions, the energy gab reach to the typical value of the bulk TiO2 (3.5) eV
American Psychological Association (APA)
Sadkhan, Azhar Kazim. 2018. Optical characterizations of rf-magnetron sputtered nanocrystalline tio2 thin film. Engineering and Technology Journal،Vol. 36, no. 2B, pp.156-159.
https://search.emarefa.net/detail/BIM-899564
Modern Language Association (MLA)
Sadkhan, Azhar Kazim. Optical characterizations of rf-magnetron sputtered nanocrystalline tio2 thin film. Engineering and Technology Journal Vol. 36, no. 2B (2018), pp.156-159.
https://search.emarefa.net/detail/BIM-899564
American Medical Association (AMA)
Sadkhan, Azhar Kazim. Optical characterizations of rf-magnetron sputtered nanocrystalline tio2 thin film. Engineering and Technology Journal. 2018. Vol. 36, no. 2B, pp.156-159.
https://search.emarefa.net/detail/BIM-899564
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references : p. 158-159
Record ID
BIM-899564