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X-Ray Reflectometry Study of Self-Assembled Ionic Nanolayers
Joint Authors
Jasiecki, Szymon
Serafińczuk, Jarosław
Gotszalk, Teodor
Schroeder, Grzegorz
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-5, 5 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-03-25
Country of Publication
Egypt
No. of Pages
5
Main Subjects
Abstract EN
The self-assembly technique has been applied for the fabrication of thin films including macrocyclic molecules.
These multilayered structures, grown by sequential deposition of oppositely charged molecules, were characterised with X-ray reflectometry.
The data obtained indicate regular thickness of ion pair layers formed regardless of the number of depositions made as well as the number of ion groups occurring in the molecule.
Savitzky-Golay algorithm was used for the calculation of the layer thickness.
Formation of self-assembled multilayers (SAMs) occurs not only for polymeric structures but also for small ionic compound systems and results from the electrostatic interaction of many strongly dissipated charges on the whole structure of the molecule.
American Psychological Association (APA)
Jasiecki, Szymon& Serafińczuk, Jarosław& Gotszalk, Teodor& Schroeder, Grzegorz. 2012. X-Ray Reflectometry Study of Self-Assembled Ionic Nanolayers. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-998247
Modern Language Association (MLA)
Jasiecki, Szymon…[et al.]. X-Ray Reflectometry Study of Self-Assembled Ionic Nanolayers. Journal of Nanomaterials No. 2012 (2012), pp.1-5.
https://search.emarefa.net/detail/BIM-998247
American Medical Association (AMA)
Jasiecki, Szymon& Serafińczuk, Jarosław& Gotszalk, Teodor& Schroeder, Grzegorz. X-Ray Reflectometry Study of Self-Assembled Ionic Nanolayers. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-5.
https://search.emarefa.net/detail/BIM-998247
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-998247