Luminescence Properties of Si Nanocrystals Fabricated by Ion Beam Sputtering and Annealing
Joint Authors
Kim, Sung
Shin, Dong Hee
Shin, Dong Yeol
Kim, Chang Oh
Park, Jae Hee
Yang, Seung Bum
Choi, Suk-Ho
Yoo, Seung Jo
Kim, Jin-Gyu
Source
Issue
Vol. 2012, Issue 2012 (31 Dec. 2012), pp.1-8, 8 p.
Publisher
Hindawi Publishing Corporation
Publication Date
2012-03-20
Country of Publication
Egypt
No. of Pages
8
Main Subjects
Abstract EN
During the past several decades, Si nanocrystals (NCs) have received remarkable attention in view of potential optoelectronic device applications.
This paper summarizes recent progress in the study of luminescence from Si NCs, such as photoluminescence (PL), cathodoluminescence, time-solved PL, and electroluminescence.
The paper is especially focused on Si NCs produced by ion beam sputtering deposition of SiOx single layer or SiOx/SiO2 multilayers and subsequent annealing.
The effects of stoichiometry (x) and thickness of SiOx layers on the luminescence are analyzed in detail and discussed based on possible mechanisms.
American Psychological Association (APA)
Kim, Sung& Shin, Dong Hee& Shin, Dong Yeol& Kim, Chang Oh& Park, Jae Hee& Yang, Seung Bum…[et al.]. 2012. Luminescence Properties of Si Nanocrystals Fabricated by Ion Beam Sputtering and Annealing. Journal of Nanomaterials،Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-998251
Modern Language Association (MLA)
Kim, Sung…[et al.]. Luminescence Properties of Si Nanocrystals Fabricated by Ion Beam Sputtering and Annealing. Journal of Nanomaterials No. 2012 (2012), pp.1-8.
https://search.emarefa.net/detail/BIM-998251
American Medical Association (AMA)
Kim, Sung& Shin, Dong Hee& Shin, Dong Yeol& Kim, Chang Oh& Park, Jae Hee& Yang, Seung Bum…[et al.]. Luminescence Properties of Si Nanocrystals Fabricated by Ion Beam Sputtering and Annealing. Journal of Nanomaterials. 2012. Vol. 2012, no. 2012, pp.1-8.
https://search.emarefa.net/detail/BIM-998251
Data Type
Journal Articles
Language
English
Notes
Includes bibliographical references
Record ID
BIM-998251